Scanning Electron Microscope (SEM) as one of the major research and industrial equipment for imaging of micro-scale samples and surfaces has gained extensive attention from its emerge. However. the acquired micrographs still remain two-dimensional (2D). In the current work a novel and highly accurate approach is proposed to recover the hidden third-dimension by use of multi-view image... https://www.hindigyanvishv.com/hot-find-Facia-Installation-Kit-Suits-Holden-Commodore-VE-Series-2-FP9550BK-Black-top-mega/